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Wonseok LateralPFM Melt Etch hard_disk Force-distance Metal-organicComplex HardDisk Lanthanum_aluminate Neodymium Optoelectonics Ucl self_assembly molecular_self_assembly ForceMapping AEAPDES exfoliate CrAu ThermalDetectors Conduct Calcium AM-KPFM FrictionalForceMicroscopy INSPParis EFM ContactModeDot BCZT BlockCopolymer Defect AnodizedAluminumOxide Polyvinylidene PS_PVAC self-assembly molecules Silver
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256