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EFM OpticalModulator Writing Friction Corrosion Defects SmallScan Carbon Silicon KevlarFiber norganic Reading ImideMonomer Au111 Polyaniline ShenYang MESA structure Polyurethane hydrocarbon DOE HexagonalBoronNitride Fiber KelvinProbeForceMicroscopy Titanate Aluminum VinylAlcohol Conduct ScanningThermalMicroscopy C36H74 MoS2 Cobalt-dopedIronOxide kelvin probe force microscopy LateralPFM Magnets EFMAmplitude
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Perovskite
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36A Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 4μm×4μm
- Scan Rate: 0.3Hz
- Pixel: 512×256