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Mobile SurfaceOxidation Monisha NUSNNI EPFL piezoelectric force microscopy LiNbO3 BaTiO3 Thermal SicMosfet Reduction SrTiO3 BCZT Ram Piezoelectric PolymerPatterns Hafnium_dioxide Alkane HOPG CP-AFM Magnetic Force Microscopy ForceVolumeImage Hafnia LogAmplifier PDMS Pattern FrictionalForceMicroscopy Co/Cr/Pt Temperature Growing Vac atomic_layer solar_cell Grain Lattice
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Graphene on SiO2
Scanning Conditions
- System: NX20
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256