-
Leakage organic_polymer FM_SKPM Fet Conducting EvatecAG Mobile Wafer PolymerBlend PolymerPatterns Pinpoint PVA SoftSample Lanthanum_aluminate SKKU StrontiumTitanate Ni-FeAlloy self-assembly Resistance China polyvinyl acetate food Glass Imprint PinpointPFM ForceVolumeMapping GaP Hafnia PDMS LithiumNiobate NCM\ IRDetector KAIST Non-ContactMode Gallium
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
2L-MoS₂ (1/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.25 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 4 Hz
- Scan Size : 2.5μm×2.5μm
- Pixel Size : 512×512
- Cantilever : ContSCPt (k=0.2N/m, f=25kHz)