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Pipette Bmp Defect phase_change PECurve Polystyrene EPFL Pzt PVA ThermalProperties PpLdpe Growth TipBiasMode SPMLabs Techcomp HiVacuum Potential Conductive AFM TemperatureControllerAFM Photovoltaics kelvin probe force microscopy BiasMode cooling UnivCollegeLondon Mosfet CuFoil Switching Polydimethylsiloxane light_emission LFM Annealed Temasek_Lab Polarization StyreneBeads CastIron
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Crystal
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256