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PFM SolarCell ElectroChemical Magnetic Force Microscopy mechanical property SurfaceOxidation SiliconCrystal Zagreb BiasMode Phenanthrene ChemicalCompound plastic Lateral Gong piezoelectric force microscopy TempControl Neodymium Silver Cross-section Temasek_Lab Praseodymium Mobile MfmAmplitude Pipette Composite 2dMaterials multi_layer Yttria_stabilized_Zirconia LowDensityPolyethylene AM-KPFM EvatecAG HighResolution temp_control CHRYSALIS_INC Magnetostrictive
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NiFe
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm