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Electical&Electronics KPFM light_emission AIN NUS_NNI_Nanocore Conductive AFM Spincast IRDetector PVAC food Hair Fendb NtuEee #EC Boundary KAIST InLiquid UnivCollegeLondon BariumTitanate BloodCell Optoelectronic Sapphire PolyimideFilm Wafer Co/Cr/Pt Dopped LateralPFM block_copolymer INSP PS_PVAC HBN FrictionForce Mechinical self-assembly hydrocarbon
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CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V