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self-assembly Calcite IcelandSpar Tin sulfide Growth STO PhaseTransition Polystyrene Fet ContactMode suspended_graphene light_emission TiO2 self-assembled_monolayer polyvinyl acetate TemperatureControlledAFM Cobalt BCZT dielectric_trench Electrical&Electronics CalciumHydroxide Defects MagneticPhase IMT_Bucharest TappingMode Filter LaAlO3 Semiconductor silicon_carbide NUS_Physics Spincast FloppyDisk GalliumPhosphide PvdfFilm ElectroDeposition
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Polymer patterns on Si (1/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256