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Butterfly Step Trench Polypropylene PvdfFilm Led MultiferroicMaterials SiliconCrystal Workfunction AtomicLayer alkanes Epoxy MESA structure Au111 Ferroelectric Conductance Techcomp MonoLayer IISCBangalore Photovoltaics AM_KPFM silicon_oxide Dr.JurekSadowski graphene_hybrid molecules Laser HighAspect Graphite Roughness Mobile Granada WWafer PS_PVAC cross section Optical
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Polymer patterns on Si (1/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256