-
Nanofiber FAFailureAnlaysis non_contact Terrace dielectric_trench Ptfe HexagonalBoronNitride MolybdenumDisulfide CHRYSALIS_INC 3-hexylthiophene PvdfBead Lateral_Force_Microscopy Silicon Optic contact Cancer light_emission SSRM pinpoint mode conductive MechanicalProperties Chloroform LiquidImaging Heating polyvinyl acetate heterojunctions LateralPFM SPMLabs SiliconCrystal FM-KPFM SolarCell Galfenol Reduction Au111 hetero_structure
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512