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TyphimuriumBiofilm BiasMode ScratchMode Indent Aluminum Lift SelfAssembly Phthalocyanine Cross-section TransitionMetal WPlug PolyvinylideneFluoride Polydimethylsiloxane Dimethicone PinPointMode LateralPFM Monisha Potential SoftSample Array TemperatureControl FM_SKPM frequency_modulation IRDetector Semiconductor PDMS KAIST Mfm semifluorinated_alkanes Composition Change Reading FailureAnalysis small_scan Defect
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Photoresist pattern (post-development process)
Scanning Conditions
- System : NX-3DM
- Scan Mode: Non-contact
- Scan Rate : 0.1 Hz
- Scan Size : 2μm×10μm
- Pixel Size : 512×2048
- Cantilever : EBD-R2-NCLR (k=45N/m, f=190kHz)