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Change ScratchMode Tungsten_disulfide BoronNitride Mosfet Heating Growing Wonseok FailureAnalysis MetalCompound Etch EFMAmplitude Materials Heat FM_KPFM AIN CarbonNanotube PtfeFilter DentalProsthesis TPU LiquidImaging SSRM Optical Conductivity CrystalGrowing ContactMode Steps SKPM SmalScan OrganicCompound LogAmplifier single_layer PolyvinylideneFluoride Adhesion exfoliate
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PS/PVAc Film
Film of Polystyrene/poly(vinyl acetate) blend on Si
Scanning Conditions
- System: NX20
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au C (k=0.6N/m, f=65kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.3Hz
- Pixel Size: 1024 × 256
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au C (k=0.6N/m, f=65kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.3Hz
- Pixel Size: 1024 × 256