-
temp ThinFilm AAO Microchannel Sapphire Gold Chloroform Croatia BiFeO3 SRAM Galfenol InorganicCompound INSP Inorganic_Compound NUS ScanningTunnelingMicroscopy ImideMonomer InLiquid OrganicSemiconductor Water hetero_structure Forevision Sadowski YttriaStabilizedZirconia ULCA ForceVolumeMapping conductive AdhesionEnergy SrTiO3 thermal_conductivity Composition LateralForce high_resolution ForceVolumeImage OpticalWaveguide
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Carbon Nanotube on Si
Scanning Conditions
- System: XE7
- Scan Mode: SThM, KPFM, PinPoint CP-AFM
- Cantilever: Nanothermal probe, NCST-Au (k=7.4N/m, f=160kHz), CDT-CONTR (k=0.5N/m, f=20kHz)
- Scan Size: 0.6μm×0.6μm
- Scan Rate: 0.5Hz, 0.5Hz, 0.15Hz
- Pixel: 256×128
- Scan Mode: SThM, KPFM, PinPoint CP-AFM
- Cantilever: Nanothermal probe, NCST-Au (k=7.4N/m, f=160kHz), CDT-CONTR (k=0.5N/m, f=20kHz)
- Scan Size: 0.6μm×0.6μm
- Scan Rate: 0.5Hz, 0.5Hz, 0.15Hz
- Pixel: 256×128