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SiliconOxide Imprint Wildtype MonoLayer ElectrostaticForceMicroscopy AM_KPFM HBN MBE self_assembly suspended_graphene LaAlO3 Piezoelectric TungstenThinFilmDeposition PS_LDPE FloppyDisk Neodymium LeakageCurrent Polarization molecular_self_assembly GlassTemp Edwin HDD conductive Zagreb Ni-FeAlloy CalciumHydroxide Conduct UnivMaryland LiNbO3 light_emission SurfaceChange LDPE CastIron ForceVolume Solution
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V