-
LeakageCurrent Piezoelectric MoS2 Insulator Topography P3HT Chloroform epitaxy Hydroxyapatite LiNbO3 UnivCollegeLondon HighAcpectRatio SoftSample SiliconCrystal SrTiO3 PrCurve FAPbI3 cannabidiol Nanostructure Patterns Nanopattern CuFoil EFMAmplitude ScratchMode Display KPFM LiIonBattery Dental University_of_Regensburg MfmAmplitude Modulus GaP norganic FAFailureAnlaysis NtuEee
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V