-
Aluminium_Oxide suspended_graphene FastScan Filter CompactDisk Scratch Insulator Deposition CVD EFM Pyroelectric atomic_steps graphene_hybrid FailureAnlaysis Current SmalScan Pinpoint PFM ShenYang LaAlO3 SSRM F14H20 Croatia Bio Electrode Gong Modulus Lateral NCM\ Phase KelvinProbeForceMicroscopy PolymerBlend Pattern ForceMapping Mosfet SiliconCrystal
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Block copolymer phase change by temp
Scanning Conditions
- System: NX10
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256