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2dMaterials ForceMapping molecule ForceVolumeImage BCZT Growth solar_cell Terrace Optical ThermalProperties VerticalPFM Mapping Platinum FrictionalForce Pores PyroelectricDetector StainlessSteel Conducting CarbonNanotube CrystalGrowing plastics Polarization LithiumNiobate Transparent Scratch HexacontaneFilm AdhesionForce Chrome chemical_compound Wildtype CrAu GaAs Global_Comm PolyvinylAcetate Optoelectonics
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WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm