-
Ecoli lift_mode IndiumTinOxide dielectric trench Sic FrictionalForce PpLdpe Galfenol NUS SRAM TappingMode PiezoelectricForceMicroscopy nanomechanical ElectroChemical Polyaniline MechanicalProperty Cobalt silicon_carbide PetruPoni_Institute DLaTGS biocompatible Temasek_Lab F14H20 light_emitting AtomicSteps ReflexLens ScanningSpreadingResistanceMicroscopy PANI atomic_layer Polymer AAO PFM MagneticPhase LateralForce temperature_control
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
GaN epi wafer
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.7 Hz
- Scan Size : 5μm×5μm
- Pixel Size : 512×512
- Cantilever : PPP-NCHR (k=42N/m, f=330kHz)