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NUS DeoxyribonucleicAcid Optic PolyimideFilm LithiumNiobate Styrene FrictionalForceMicroscopy KevlarFiber PrCurve KAIST dielectric_trench NanoLithography DataStorage PolymerPatterns Floppy strontiu_titanate Holes PS_LDPE Electrode Chungnam_National_University Etch Titanate Molybdenum TipBiasMode Organic CalciumHydroxyapatite Conductive AFM Microchannel PetruPoni_Institute Dimethicone Topography PDMS Al2O3 Wonseok FrictionalForce
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256