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Fujian semifluorinated_alkanes HexagonalBoronNitride TPU KPFM HBN Wafer NusEce Polyvinylidene_fluoride EPFL PinPointMode exfoliate SmalScan Fe_film CalciumHydroxyapatite LMF TappingMode WWafer SKPM Treatment HafniumDioxide Chungnam_National_University Vac ElectrostaticForceMicroscopy Dr.JurekSadowski RedBloodCell Polyaniline OrganicSemiconductor IISCBangalore MBE Melt ScanningTunnelingMicroscopy SoftSample Ecoli Phenanthrene
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Polycrystalline ferroelectric BCZT
Scanning Conditions
- System: NX12
- Scan Mode: PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.4Hz
- Pixel: 256×256
- Sample bias sweep range for Piezoresponse curve: -10V ~ +10V