-
Conductive AFM Pores Varistor LeakageCurrent DNA Yeditepe_University LiftHeight Nanopattern SSRM lift_mode Lattice FM_KPFM Spincast SelfAssembly FAFailureAnlaysis MembraneFilter Conductivity Platinum PpLdpe HardDisk Indent contact Oxide BiFeO3 Molybdenum Nanotechnology Sio2 Film MechanicalProperty TemperatureControllerAFM dielectric trench Growing plastics Thermoplastic_polyurethane TyphimuriumBiofilm
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
F14H20
Semifluorinated alkanes on Si.
Scanning Conditions
- System: NX20
- Scan Mode: Tapping
- Cantilever: AD40AS (k=40N/m, f=180kHz)
- Scan Size: 5μm×5μm, 1μm×1μm
- Scan Rate: 05Hz, 1Hz
- Pixel Size: 1024 × 512, 512 x 256
- Scan Mode: Tapping
- Cantilever: AD40AS (k=40N/m, f=180kHz)
- Scan Size: 5μm×5μm, 1μm×1μm
- Scan Rate: 05Hz, 1Hz
- Pixel Size: 1024 × 512, 512 x 256