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SRAM Ni81Fe19 PinPointMode Ito KPFM molecular_beam TipBiasMode Mechanical piezoelectric force microscopy PolyStylene align Treatment silicon_oxide PvdfBead MoirePattern atomic_layer SThM ElectrostaticForceMicroscopy Fendb PVAP3HT Potential SiliconOxide TemperatureControllerStage Au111 CeNSE_IISc PDMS Change HexacontaneFilm Polystyrene Pyroelectric Phthalocyanine Bacterium Biology exfoliate electrospinning
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Patterned Sapphire Substrate (PSS)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256