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ContactMode MfmAmplitude Barium_titanate ULCA Hexatriacontane Leakage Boundary Array LateralForceMicroscopy CrAu Domain CuSubstrate MultiLayerCeramicCapacitor Sio2 Stiffness CeNSE_IISc I-VSpectroscopy 2d_materials TemperatureControlledAFM CVD hydrocarbon Filter Chungnam_National_University nanomechanical AM_KPFM Co/Cr/Pt HDD fluoroaalkane Growth P3HT Indium_tin_oxide organic_polymer LightEmission Magnets exfoliate
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Graphene on SiO2
Scanning Conditions
- System: NX20
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256