ScanningIon-ConductanceMicroscopy single_layer contact Moire SetpointMode dielectric trench Chloroform ForceVolumeImage MultiLayerCeramicCapacitor Ram PolymerPatterns Forevision Materials MembraneFilter HighAcpectRatio TyphimuriumBiofilm CrAu molecular_self_assembly Litho Granada ForceDistanceSpectroscopy Sapphire AmplitudeModulation piezoelectric force microscopy C36H74 SFAs Pinpoint Polystyrene Korea Implant Defect UTEM Typhimurium ContactMode Yttria_stabilized_Zirconia