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Mechanical Patterns ForceMapping FFM AdhesionForce EPFL SelfAssembly semifluorinated alkane membrane Ananth piezoelectric force microscopy molecule Hole Optoelectonics FM_SKPM Steps EvatecAG temp_control TipBiasMode HydroGel solar_cell PolymerBlend Trench FrictionalForceMicroscopy Vac PhaseImaging SurfaceOxidation Vinylpyridine Defects IISCBangalore Zhi pinpoint mode Silicon Polarization CrossSection
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Block copolymer phase change by temp
Scanning Conditions
- System: NX10
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256