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SurfaceChange Multiferroic_materials AtomicLayer Gong BCZT Vinylpyridine FM_KPFM OpticalElement TriGlycineSulphate DeoxyribonucleicAcid Organic cross section chemical_compound pinpoint mode Metal-organicComplex Cross-section CastIron sputter CaMnO3 SrO ShenYang Boundary CompactDisk Kevlar Friction Ram HexagonalBoronNitride KPFM GaAs Patterns fluoroalkane PolyimideFilm MagneticForce pulsed_laser_deposition mechanical property
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Domain switching on PZT
Scanning Conditions
- System: NX10
- Scan Mode: Lithography, PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black +10V, White -10V