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Polyethylene LateralForce bias_mode Annealing CVD Sadowski Hexylthiophene NCM Global_Comm NCM\ Biology layers Treatment SurfaceOxidation YttriaStabilizedZirconia MBE Current TungstenThinFilmDeposition HumanHair MetalCompound Workfunction dielectric trench OrganicCompound Sic Magnetic Force Microscopy Mechanical suspended_graphene FM_KPFM MultiferroicMaterials CompactDisk NUS_NNI_Nanocore Microchannel Piezoresponse Scanning_Thermal_Microscopy PS_PVAC
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256