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AEAPDES Insulator Carbon Etch TipBiasMode AM_SKPM EFM BismuthFerrite Defects GaN semifluorinated_alkane AAO Temasek_Lab HumanHair PolymerPatterns Mechinical ring shape Boundary flakes LiquidCrystal Fujian Layer Force-distance DIWafer Calcite TriGlycineSulphate IIT-chennai LiNbO3 mechanical property LiftMode PinpointPFM China SingleCrystal GalliumPhosphide Conduct
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Adhesive system
Scanning Conditions
- System: NX10
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256