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heterojunctions Celebration BiasMode Ceramics Transparent Lateral_Force_Microscopy FAPbI3 LateralForceMicroscopy Wafer Sperm Carbon Conducting Force-distance semifluorinated alkane CeramicCapacitor NUS_NNI_Nanocore PtfeMembrane Laser bias_mode Copper Vortex MoS2 DomainSwitching Neodymium Indent 2d_materials hydrocarbon lithography Polyvinylidene HighAcpectRatio H-BN Yeditepe_University HighAspect Growing CopperFoil
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Polytetrafluoroethylene membrane filter
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 25μm×25μm
- Scan Rate: 0.1Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 25μm×25μm
- Scan Rate: 0.1Hz
- Pixel: 512×512