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AM_KPFM CNT Co/Cr/Pt Sic alkanes ForceDistanceSpectroscopy Hafnium_dioxide Lanthanum_aluminate Conductance Polyvinylidene NusEce kelvin probe force microscopy MBE Molybdenum_disulfide ring shape AM_SKPM Display Sio2 ito_film Filter Ram Anneal Ceramic EvatecAG BaTiO3 LightEmiting Cobalt-dopedIronOxide LiftHeight CrystalGrowing ThinFilm Neodymium HardDiskMedia SrTiO3 GaN Temperature
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Domain switching on PZT
Scanning Conditions
- System: NX10
- Scan Mode: Lithography, PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black +10V, White -10V