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Sadowski NUSNNI MESA structure Phenanthrene Polyethylene Led DeflectionOptics flakes GaP Conducting membrane Pinpoint fluoroaalkane Polyvinylidene TyphimuriumBiofilm LiNbO3 dielectric trench Iron Pyroelectric DomainSwitching oxide_layer TungstenDeposition Vac bias_mode Heat AM_SKPM CuSubstrate VortexCore Ni-FeAlloy ScanningIon-ConductanceMicroscopy Conductive AFM IIT-chennai Dr.JurekSadowski Boundary ito_film
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Copper Foil
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.5Hz
- Pixel: 512512