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Wafer Holes NanoLithography Tin sulfide LateralForce Ni-FeAlloy NUS_NNI_Nanocore #Materials FM-KPFM TPU MultiferroicMaterials Workfunction LogAmplifier semifluorinated alkane Heat Morphology MetalCompound Sic CVD PtfeFilter Temasek_Lab Yeditepe GranadaUniv Gallium PFM Al2O3 DomainSwitching ThermalProperties ThinFilm Transparent CrystalGrowing TemperatureControllerAFM INSP PolyStylene Conducting
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Polyaniline (PANI)
Scanning Conditions
- System: XE7
- Scan Mode: Non-contact
- Cantilever: ACTA (k=40N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 512×512