-
WS2 Hole Formamidinium_lead_iodide Hexatriacontane lift_mode norganic PiezoelectricForceMicroscopy Carbon Graphene hard_disk_media MeltingPoint SingleCrystal vertical_PFM Polyvinylidene_fluoride HardDiskMedia Aluminum Ferroelectric Etch HexacontaneFilm FFM TemperatureControlledAFM PhthalocyaninePraseodymium IISCBangalore KelvinProbeForceMicroscopy layers Photovoltaics ElectrostaticForceMicroscopy Gallium_Arsenide Adhesive Dopped SmalScan TungstenDeposition Jason BaTiO3 Conduct
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Cutting Graphene
Scanning Conditions
- System : FX40
- Scan Mode: Contact after lithography
- Scan Rate : 0.7 Hz
- Scan Size : 30μm×30μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)
- Lithography condition : Force 500 nN, writing speed 0.1μm/s, AC bias 10 V @ 40kHz