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UTEM Ferroelectric PhaseChange Pvdf SetpointMode Electical&Electronics SrTiO3 PvdfFilm DeoxyribonucleicAcid margarine SurfaceOxidation Strontium self-assembled_monolayer Fiber Fet graphene_hybrid Hafnium_dioxide FailureAnlaysis BoronNitride Organic Protein BiasMode Aluminum Polyimide Boundary P3HT ForceMapping Led SiliconOxide PinpointNanomechanicalMode lithography biocompatible Defect Nickel C60H122
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Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)