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StrontiuTitanate self-assembled_monolayer DeflectionOptics Pyroelectric molecular_self_assembly Cobalt-dopedIronOxide Copper Polarization CaMnO3 Magnets TempControl atomic_steps Mfm ForceMapping Polyvinylidene NUSNNI CeramicCapacitor LateralForce Vortex FrequencyModulation PyroelectricDetector SThM ConductiveAFM Tapping frequency_modulation TransitionMetal ItoGlass GlassTemperature HiVacuum Piezoresponse Genetic PolyStylene PVA I-VSpectroscopy Cancer
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Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)