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Ferroelectric atomic_steps HexagonalBN SelfAssembly Polyaniline ElectroChemical Litho GalliumPhosphide multi_layer Granada Semiconductor MfmAmplitude MBE Ucl Nanotechnology Bismuth Defect medical Composition UTEM margarine Hexylthiophene WS2 DentalProsthesis ThermalDetectors Corrosion Switching NUS_Physics light_emission Dimethicone Sidewall SKPM LiftMode ElectrostaticForceMicroscopy KevlarFiber
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Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)