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molecules Pipette temp_control mono_layer FrictionalForceMicroscopy GalliumPhosphide Ni-FeAlloy Roughness ScratchMode Silver Scanning_Thermal_Microscopy LiquidImaging ThermalConductivity Conduct Film Hexatriacontane MfmAmplitude Iron AM-KPFM Thermal Galfenol PetruPoni_Institute Adhesive chemical_compound SmalScan Chrome PFM epitaxy Laser Current Christmas DOE semifluorinated alkane SrO Lanthanum_aluminate
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TSV Cu pad oxidation
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)