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ConductingPolymer GlassTemp Reading PhaseChange thermal_conductivity TungstenThinFilmDeposition Boundary PolyStylene Polyvinylidene_fluoride self-assembled_monolayer Ptfe OpticalWaveguides Switching Piranha ContactMode PetruPoni_Institute INSPParis Ni-FeAlloy Molybdenum HDD BiVO4 Lanthanum_aluminate Roughness molecules SetpointMode Hexacontane ContactModeDot Sic Metal EPFL Optoelectonics Hexylthiophene ForceDistanceSpectroscopy dielectric trench cross section
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Defect of LinbO₃
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.3 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 1024×512
- Cantilever : SCOUT 350 (k=42N/m, f=350kHz)