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PS_LDPE Electical&Electronics SelfAssembly contact Tin disulfide Pzt NUS_NNI_Nanocore Alloy Leakage optoelectronics Polyaniline ThermalDetectors Holes BiasMode Inorganic Beads CP-AFM nanobar Etch BismuthVanadate PS_PVAC Fujian silicon_oxide TemperatureControlledAFM Silicon Platinum VerticalPFM Boundary Battery Protein Terrace PMNPT self-assembled_monolayer Ceramics self_healing
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Defect of LinbO₃
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.3 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 1024×512
- Cantilever : SCOUT 350 (k=42N/m, f=350kHz)