-
Nanofiber Imprint epitaxy MagneticPhase Domain ring shape Dental Hydroxyapatite ConductiveAFM Polypropylene cooling MechanicalProperty mechanical_property Singapore Cross-section SKKU silicon_carbide Blend BismuthFerrite MLCC dielectric trench Topography MetalCompound FM_KPFM fluorocarbon Chrome PDMS PolyStylene TappingMode Dr.JurekSadowski Growing SRAM PolymerBlend ElectroChemical Edwin
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Trench Etch Profile on MESA
Top dielectric trench etch profile on MESA on Si wafer.
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 6μm×6μm
- Scan Rate: 0.12Hz
- Pixel Size: 1024 × 256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 6μm×6μm
- Scan Rate: 0.12Hz
- Pixel Size: 1024 × 256