-
Modulus Nanopattern Polystyrene #Materials CuParticle Mechanical Mfm CarbonNanotube Laser temp Vortex Potential ConductiveAFM Conductivity Device Hysteresys Cancer EvatecAG Sphere P3HT ItoGlass GlassTemp Phase FuelCell Wafer LateralForce Chemical_Vapor_Deposition Chrome Ram UTEM FrictionForce CrAu mechanical property Calcite DOE
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Trench Etch Profile on MESA
Top dielectric trench etch profile on MESA on Si wafer.
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 6μm×6μm
- Scan Rate: 0.12Hz
- Pixel Size: 1024 × 256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 6μm×6μm
- Scan Rate: 0.12Hz
- Pixel Size: 1024 × 256