-
SKKU Nanotechnology India FloppyDisk DentalProsthesis Trench PVA Galfenol Photovoltaics Current Thermal dielectric trench BiFeO3 fluoroalkane MultiferroicMaterials Alkane OpticalElement Mfm LithiumNiobate IndiumTinOxide AdhesionEnergy doped Oxidation IcelandSpar Friction Hafnia Lanthanum_aluminate NUS_Physics Thermoplastic_polyurethane Silicon margarine polyvinyl acetate KPFM Polytetrafluoroethylene LateralForceMicroscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BN thin film on Si
Scanning Conditions
- System: NX10
- Scan Mode:SThM
- Cantilever: Nanothermal probe
- Scan Size: 25μm×25μm, 5μm×5μm
- Scan Rate:0.3Hz, 0.5Hz
- Pixel: 256×256, 256×256
- Scan Mode:SThM
- Cantilever: Nanothermal probe
- Scan Size: 25μm×25μm, 5μm×5μm
- Scan Rate:0.3Hz, 0.5Hz
- Pixel: 256×256, 256×256