-
piezoelectric force microscopy Electical&Electronics Crystal Filter ReflexLens UnivOfMaryland Wonseok StrontiumTitanate Thermoplastic_polyurethane PinpointNanomechanicalMode Fet AlkaneFilm SelfAssembly contact NCM\ Hafnium_dioxide CancerCell LateralForce ScanningTunnelingMicroscopy Fujian Chloroform DNA Battery LDPE Growing Transparent HighAspect BreastCancerCell 2-vinylpyridine dielectric trench MembraneFilter DentalProsthesis Deposition Litho SetpointMode
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Kevlar fiber
Scanning Conditions
- System: XE7
- Scan Mode: NCM, F/D mapping
- Cantilever: Diamond probe(k=151N/m, f=50kHz)
- Scan Size:15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×256
- Scan Mode: NCM, F/D mapping
- Cantilever: Diamond probe(k=151N/m, f=50kHz)
- Scan Size:15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×256