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Conductance #EC BCZT self-assembly Cancer Insulator mfm_amplitude plastics I-VSpectroscopy thermal_conductivity Biofilm MechanicalProperties FastScan non_contact PMNPT CrAu Lateral AM-KPFM UnivMaryland StainlessSteel Stiffness silicon_oxide DataStorage Modulus ForceMapping MagneticArray Self-assembledMonolayer NUS_NNI_Nanocore IVSpectroscopy Etch self_assembly ULCA Pzt LiBattery Deposition
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Christmas ball lithography on Si substrate
Scanning Conditions
- System: NX10
- Scan Mode: Contact, lithography
- Cantilever: : ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 30μm×30μm
- Scan Rate: 0.5Hz
- Pixel: 512×512