The Most Extensible AFM Solution
Supports Park’s most extensive range of SPM modes and options in the industry
Today's researchers need to characterize a wide range of physical properties under diverse measurement conditions and sample environments. Park Systems provides the most extensive range of SPM modes, the largest number of AFM options, and the best option compatibility and upgradeability in the industry for advanced sample characterization.
Park NX7 has the most extensive range of SPM modes
Topography Imaging
Dielectric/Piezoelectric Properties
- Piezoelectric Force Microscopy (PFM)
- PFM with High Voltage
- Piezoresponse Spectroscopy
Magnetic Properties
Electrical Properties
Mechanical Properties
- Force Modulation Microscopy (FMM)
- Nanoindentation
- Nanolithography
- Nanolithography with High Voltage
- Nanomanipulation
- Lateral Force Microscopy (LFM)
- Force Distance (F/d) Spectroscopy
- Force Volume Imaging
Chemical Properties
- Chemical Force Microscopy with Functionalized Tip
- Electrochemical Microscopy (EC-AFM)