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CrossSection SurfaceOxidation PetruPoni_Institute Piezo Composite PhaseTransition MultiLayerCeramicCapacitor Aluminium_Oxide Austenite Forevision bias_mode C_AFM C60H122 NanoLithography Array Mechanical&nanotechnology Dr.JurekSadowski #EC Sic PMNPT Techcomp fe_nd_b Litho Beads Tapping BTO Genetic ScanningIon-ConductanceMicroscopy Sulfur Boron silicon_carbide Crystal UnivOfMaryland Chemical Vapor Deposition Metal-organicComplex
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Alkane Film (C60H122)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm, 0.5μm×0.5μm
- Scan Rate: 0.8Hz, 0.8Hz
- Pixel: 512×512, 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm, 0.5μm×0.5μm
- Scan Rate: 0.8Hz, 0.8Hz
- Pixel: 512×512, 512×512