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DiffractiveOpticalElements SAM LiftMode ElectroDeposition Nanopattern FrictionalForce SrO 3-hexylthiophene blended polymers PolyvinylideneFluoride LiquidCell molecular_self_assembly Chungnam_National_University Typhimurium PtfeFilter LifeScience dielectric_trench Pipette PFM Magnets BiasMode Potential thermoplastic_elastomers Ni-FeAlloy Metal-organicComplex FM_KPFM FailureAnalysis Molybdenum_disulfide ForceDistanceSpectroscopy LiquidCrystal MoS2 PvdfBead Growing Pinpoint PFM EPFL
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NiFe
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm