-
Moire MeltingPoint SingleCrystal pulsed_laser_deposition AlkaneFilm PinpointNanomechanicalMode Litho Anneal Composition BaTiO3 KAIST Optical Bmp Etch HanyangUniv SKPM Electrical&Electronics VortexCore Mosfet Lateral Battery Sphere Phosphide WWafer bias_mode ElectroDeposition tip_bias_mode VinylAlcohol PVAC DOE DIWafer F14H20 FloppyDisk Silicon Typhimurium
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Co/Cr/Pt
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm