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Sapphire LaAlO3 dielectric trench hetero_structure Temasek_Lab Bacterium EFMAmplitude VerticalPFM HexacontaneFilm Sperm Blend Mobile ItoGlass temp margarine bias_mode CeramicCapacitor NiFe Polydimethylsiloxane ElectrostaticForceMicroscopy layers sputter Styrene CrystalGrowing FloppyDisk Electronics Anneal TemperatureControllerStage NusEce SAM NCM CarbonNanotube PFM SPMLabs FrictionalForceMicroscopy
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Floppy
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256