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Tin sulfide ItoGlass FrictionalForce DomainSwitching MoirePattern Electrical&Electronics PolycrystallineFerroelectricBCZT amplitude_modulation PinPointMode PDMS GlassTemperature STO Pore OpticalWaveguide Fluoride ScanningSpreadingResistanceMicroscopy OrganicSemiconductor Fe_film UnivOfMaryland temperature_control BoronNitride DIWafer PetruPoni Pattern electrospinning IISCBangalore CHRYSALIS_INC Foil Carbon KAIST FailureAnlaysis Non-ContactMode Mobile MeltingPoint Metal-organicComplex
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Semi-fluorinated alkanes
Scanning Conditions
- System : NX10
- Scan Mode: Sideband KPFM
- Scan Rate : 0.4 Hz
- Scan Size : 500nm×500nm
- Pixel Size : 256×256
- Cantilever : HQ: NSC14/CR-AU (k=5N/m, f=160kHz)