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Copolymer ScanningThermalMicroscopy oxide_layer Ananth SiliconeOxide PUR semifluorinated_alkane graphene_hybrid Optoelectronic GaAs IMT_Bucharest HanyangUniv Potential HafniumDioxide LateralForceMicroscopy Yttria_stabilized_Zirconia Laser Force-distance mfm_amplitude Polyurethane Piezoelectric NeodymiumMagnets Mapping Writing kelvin probe force microscopy Aggregated_molecules Gallium Molybdenum_disulfide Aluminium_Oxide Reading AIN PatternedSapphireSubstrat Polydimethylsiloxane gallium_nitride STM
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PS/LDPE
Spincast layer of PS/LDPE blend on Si.
Scanning Conditions
- System: NX20
- Scan Mode: Tapping
- Cantilever: AD40AS (k=40N/m, f=180kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel Size: 512 × 256
- Scan Mode: Tapping
- Cantilever: AD40AS (k=40N/m, f=180kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel Size: 512 × 256