Park NX7 Specifications
Scanner
Z Scanner
flexure guided high-force scanner
Scan range: 15 μm (optional 30 μm)
XY Scanner
single module flexure with closed-loop control
Scan range: 50 µm × 50 µm
(optional 10 μm × 10 μm or 100 μm × 100 μm)
Stage
Z Stage
Z stage range: 26 mm
XY Stage
XY stage range: 13 mm X 13 mm
Sample Mount
Sample size : Up to 50 mm
Thickness: Up to 20 mm
Software
SmartScanTM
AFM system control and data acquisition software
Auto mode for quick setup and easy imaging
Manual mode for advanced use and finer scan control
SmartAnalysisTM
AFM data analysis software
Stand-alone design—can install and analyze data away from AFM
Capable of producing 3D renders of acquired data