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Lateral_Force_Microscopy GranadaUniv SrTiO3 Polyethylene 3-hexylthiophene Topography Molybdenum DLaTGS SFAs PolyimideFilm VortexCore ThermalDetectors ScratchMode temperature controller AFM Ferroelectric Inorganic PhaseImaging Copper BTO AdhesionEnergy Potential Piezoelectric ScanningSpreadingResistanceMicroscopy cannabinoid C_AFM Sphere Metal-organicComplex Au111 AtomicLayer StyreneBeads Fe_film Mechanical Wonseok 2-vinylpyridine Film
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Block copolymer ; Fast scan
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm
- Scan Rate: 6Hz, 13Hz
- Pixel: 256×256
- Scan Mode: Tapping
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm
- Scan Rate: 6Hz, 13Hz
- Pixel: 256×256