-
fifber Galfenol Film CrAu SetpointMode hard_disk Cancer PtfeFilter Mosfet NCM dielectric_trench HACrystal Aluminum Croatia Gallium_Arsenide Chungnam_National_University Sphere IIT-chennai Anneal TemperatureControllerStage ImideMonomer Stiffness OpticalWaveguides LogAmplifier EFM pinpoint mode vertical_PFM Optoelectronic NtuEee Phase Calcite SPMLabs Au111 OxideLayer University_of_Regensburg
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256