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silicon_carbide PFM sputter Wonseok C60H122 IISCBangalore BoronNitride chemical_compound NtuEee Boron Optoelectonics StainlessSteel F14H20 LateralPFM SmallScan DNA CrystalGrowing Hexylthiophene VinylAlcohol PDMS Lattice SelfAssembly PinPointMode SFAs UTEM Hydroxyapatite AtomicSteps Etch Grain ItoGlass HACrystal OpticalWaveguides I-VSpectroscopy NCM CVD
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CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256