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Topography HanyangUniv Crystal MultiLayerCeramicCapacitor Led KelvinProbeForceMicroscopy SurfaceChange TPU semifluorinated_alkanes Pyroelectric high_resolution Anneal FailureAnalysis PatternedSapphireSubstrat Vac Sidewall 2d_materials Adhesion Sadowski Mosfet NCM\ Electronics SelfAssembly Self-assembledMonolayer Temasek_Lab Ito Dopped Hole mechanical_property Adhesive EFMAmplitude MagneticForce PetruPoni Polyethylene Al2O3
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Polymers
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512