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Lift Polyvinylidene_fluoride Chungnam_National_University semifluorinated alkane Pvdf Transparent Platinum Dental LiquidImaging frequency_modulation Vacuum semifluorinated_alkanes MagneticForce Etch Force-distance Optical ScanningThermalMicroscopy SoftSample LowDensityPolyethylene CeramicCapacitor ContactMode CancerCell PVAC multi_layer BismuthFerrite Inorganic CP-AFM Melt Fluoride Reading TipBiasMode Thermal BiFeO3 2d_materials Co/Cr/Pt
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CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V